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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Exploring Transformers for Multi-Label Classification of Java Vulnerabilities

Participants in the publication
Cláudia Mamede (Author)
Eduard Pinconschi (Author)
Rui Abreu (Author)
José Campos (Author)
Dep. Informática
 LASIGE
Date of Publication
2022-12

Institution
FACULDADE DE CIÊNCIAS DA UNIVERSIDADE DE LISBOA

Event
2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS)

Publication Identifiers

Address
Guangzhou, China

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/qrs57517.2022.00015
URL - http://dx.doi.org/10.1109/qrs57517.2022.00015


Export

APA
Cláudia Mamede, Eduard Pinconschi, Rui Abreu, José Campos, (2022). Exploring Transformers for Multi-Label Classification of Java Vulnerabilities. 2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS), -

IEEE
Cláudia Mamede, Eduard Pinconschi, Rui Abreu, José Campos, "Exploring Transformers for Multi-Label Classification of Java Vulnerabilities" in 2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS), Guangzhou, China, 2022, pp. -, doi: 10.1109/qrs57517.2022.00015

BIBTEX
@InProceedings{59989, author = {Cláudia Mamede and Eduard Pinconschi and Rui Abreu and José Campos}, title = {Exploring Transformers for Multi-Label Classification of Java Vulnerabilities}, booktitle = {2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS)}, year = 2022, pages = {-}, address = {Guangzhou, China}, publisher = {IEEE} }