Export
APA
M. Kaiser, R. Griessl, N. Kucza, C. Haumann, L. Tigges, K. Mika, J. Hagemeyer, F. Porrmann, U. Ruckert, M. vor dem Berge, S. Krupop, M. Porrmann, M. Tassemeier, P. Trancoso, F. Qararyah, S. Zouzoula, A. Casimiro, A. Bessani, J. Cecilio, S. Andersson, O. Brunnegard, O. Eriksson, R. Weiss, F. Mcierhofer, H. Salomonsson, E. Malekzadeh, D. Odman, A. Khurshid, P. Felber, M. Pasin, V. Schiavoni, J. Menetrey, K. Gugala, P. Zierhoffer, E. Knauss, H. Heyn, (2022). VEDLIoT: Very Efficient Deep Learning in IoT. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), -
IEEE
M. Kaiser, R. Griessl, N. Kucza, C. Haumann, L. Tigges, K. Mika, J. Hagemeyer, F. Porrmann, U. Ruckert, M. vor dem Berge, S. Krupop, M. Porrmann, M. Tassemeier, P. Trancoso, F. Qararyah, S. Zouzoula, A. Casimiro, A. Bessani, J. Cecilio, S. Andersson, O. Brunnegard, O. Eriksson, R. Weiss, F. Mcierhofer, H. Salomonsson, E. Malekzadeh, D. Odman, A. Khurshid, P. Felber, M. Pasin, V. Schiavoni, J. Menetrey, K. Gugala, P. Zierhoffer, E. Knauss, H. Heyn, "VEDLIoT: Very Efficient Deep Learning in IoT" in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 2022, pp. -,
doi: 10.23919/date54114.2022.9774653
BIBTEX
@InProceedings{56568,
author = {M. Kaiser and R. Griessl and N. Kucza and C. Haumann and L. Tigges and K. Mika and J. Hagemeyer and F. Porrmann and U. Ruckert and M. vor dem Berge and S. Krupop and M. Porrmann and M. Tassemeier and P. Trancoso and F. Qararyah and S. Zouzoula and A. Casimiro and A. Bessani and J. Cecilio and S. Andersson and O. Brunnegard and O. Eriksson and R. Weiss and F. Mcierhofer and H. Salomonsson and E. Malekzadeh and D. Odman and A. Khurshid and P. Felber and M. Pasin and V. Schiavoni and J. Menetrey and K. Gugala and P. Zierhoffer and E. Knauss and H. Heyn},
title = {VEDLIoT: Very Efficient Deep Learning in IoT},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
year = 2022,
pages = {-},
address = {Antwerp, Belgium},
publisher = {IEEE}
}