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Detalhes Referência

Tipo
Artigos em Conferência

Tipo de Documento
Artigo Completo

Título
VEDLIoT: Very Efficient Deep Learning in IoT

Participantes na publicação
M. Kaiser (Author)
R. Griessl (Author)
N. Kucza (Author)
C. Haumann (Author)
L. Tigges (Author)
K. Mika (Author)
J. Hagemeyer (Author)
F. Porrmann (Author)
U. Ruckert (Author)
M. vor dem Berge (Author)
S. Krupop (Author)
M. Porrmann (Author)
M. Tassemeier (Author)
P. Trancoso (Author)
F. Qararyah (Author)
S. Zouzoula (Author)
A. Casimiro (Author)
Dep. Informática
LASIGE
A. Bessani (Author)
Dep. Informática
LASIGE
J. Cecilio (Author)
Dep. Informática
LASIGE
S. Andersson (Author)
O. Brunnegard (Author)
O. Eriksson (Author)
R. Weiss (Author)
F. Mcierhofer (Author)
H. Salomonsson (Author)
E. Malekzadeh (Author)
D. Odman (Author)
A. Khurshid (Author)
P. Felber (Author)
M. Pasin (Author)
V. Schiavoni (Author)
J. Menetrey (Author)
K. Gugala (Author)
P. Zierhoffer (Author)
E. Knauss (Author)
H. Heyn (Author)

Data de Publicação
2022-03-14

Evento
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Identificadores da Publicação

Local
Antwerp, Belgium

Editora
IEEE

Identificadores do Documento
DOI - https://doi.org/10.23919/date54114.2022.9774653
URL - http://dx.doi.org/10.23919/date54114.2022.9774653

Identificadores de Qualidade
CORE B (2021) -


Exportar referência

APA
M. Kaiser, R. Griessl, N. Kucza, C. Haumann, L. Tigges, K. Mika, J. Hagemeyer, F. Porrmann, U. Ruckert, M. vor dem Berge, S. Krupop, M. Porrmann, M. Tassemeier, P. Trancoso, F. Qararyah, S. Zouzoula, A. Casimiro, A. Bessani, J. Cecilio, S. Andersson, O. Brunnegard, O. Eriksson, R. Weiss, F. Mcierhofer, H. Salomonsson, E. Malekzadeh, D. Odman, A. Khurshid, P. Felber, M. Pasin, V. Schiavoni, J. Menetrey, K. Gugala, P. Zierhoffer, E. Knauss, H. Heyn, (2022). VEDLIoT: Very Efficient Deep Learning in IoT. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), -

IEEE
M. Kaiser, R. Griessl, N. Kucza, C. Haumann, L. Tigges, K. Mika, J. Hagemeyer, F. Porrmann, U. Ruckert, M. vor dem Berge, S. Krupop, M. Porrmann, M. Tassemeier, P. Trancoso, F. Qararyah, S. Zouzoula, A. Casimiro, A. Bessani, J. Cecilio, S. Andersson, O. Brunnegard, O. Eriksson, R. Weiss, F. Mcierhofer, H. Salomonsson, E. Malekzadeh, D. Odman, A. Khurshid, P. Felber, M. Pasin, V. Schiavoni, J. Menetrey, K. Gugala, P. Zierhoffer, E. Knauss, H. Heyn, "VEDLIoT: Very Efficient Deep Learning in IoT" in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 2022, pp. -, doi: 10.23919/date54114.2022.9774653

BIBTEX
@InProceedings{56568, author = {M. Kaiser and R. Griessl and N. Kucza and C. Haumann and L. Tigges and K. Mika and J. Hagemeyer and F. Porrmann and U. Ruckert and M. vor dem Berge and S. Krupop and M. Porrmann and M. Tassemeier and P. Trancoso and F. Qararyah and S. Zouzoula and A. Casimiro and A. Bessani and J. Cecilio and S. Andersson and O. Brunnegard and O. Eriksson and R. Weiss and F. Mcierhofer and H. Salomonsson and E. Malekzadeh and D. Odman and A. Khurshid and P. Felber and M. Pasin and V. Schiavoni and J. Menetrey and K. Gugala and P. Zierhoffer and E. Knauss and H. Heyn}, title = {VEDLIoT: Very Efficient Deep Learning in IoT}, booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, year = 2022, pages = {-}, address = {Antwerp, Belgium}, publisher = {IEEE} }