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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance

Participants in the publication
Alexandre Cabral (Author)
Dep. Física
LOLS
IA
Manuel Abreu (Author)
LOLS
IA
José M. Rebordão (Author)
Dep. Física
LOLS
IA
Vitor Oliveira (Author)
INSTITUTO PORTUGUÊS DE QUALIDADE

Date of Publication
2010-08-01

Event
SPIE Optical Engineering + Applications

Publication Identifiers

Address
San Diego, California, United States

Publisher
SPIE

Document Identifiers
DOI - https://doi.org/10.1117/12.859120
URL - http://dx.doi.org/10.1117/12.859120


Export

APA
Alexandre Cabral, Manuel Abreu, José M. Rebordão, Vitor Oliveira, (2010). Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance. SPIE Optical Engineering + Applications, -

IEEE
Alexandre Cabral, Manuel Abreu, José M. Rebordão, Vitor Oliveira, "Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance" in SPIE Optical Engineering + Applications, San Diego, California, United States, 2010, pp. -, doi: 10.1117/12.859120

BIBTEX
@InProceedings{50878, author = {Alexandre Cabral and Manuel Abreu and José M. Rebordão and Vitor Oliveira}, title = {Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance}, booktitle = {SPIE Optical Engineering + Applications}, year = 2010, pages = {-}, address = {San Diego, California, United States}, publisher = {SPIE} }