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Detalhes Referência

Tipo
Artigos em Conferência

Tipo de Documento
Artigo Completo

Título
Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance

Participantes na publicação
Alexandre Cabral (Author)
Dep. Física
LOLS
IA
Manuel Abreu (Author)
LOLS
IA
José M. Rebordão (Author)
Dep. Física
LOLS
IA
Vitor Oliveira (Author)
INSTITUTO PORTUGUÊS DE QUALIDADE

Data de Publicação
2010-08-01

Evento
SPIE Optical Engineering + Applications

Identificadores da Publicação

Local
San Diego, California, United States

Editora
SPIE

Identificadores do Documento
DOI - https://doi.org/10.1117/12.859120
URL - http://dx.doi.org/10.1117/12.859120


Exportar referência

APA
Alexandre Cabral, Manuel Abreu, José M. Rebordão, Vitor Oliveira, (2010). Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance. SPIE Optical Engineering + Applications, -

IEEE
Alexandre Cabral, Manuel Abreu, José M. Rebordão, Vitor Oliveira, "Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance" in SPIE Optical Engineering + Applications, San Diego, California, United States, 2010, pp. -, doi: 10.1117/12.859120

BIBTEX
@InProceedings{50878, author = {Alexandre Cabral and Manuel Abreu and José M. Rebordão and Vitor Oliveira}, title = {Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance}, booktitle = {SPIE Optical Engineering + Applications}, year = 2010, pages = {-}, address = {San Diego, California, United States}, publisher = {SPIE} }