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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away

Participants in the publication
Sina Shamshiri (Author)
Jose Campos (Author)
Gordon Fraser (Author)
Phil McMinn (Author)

Date of Publication
2017-05

Event
2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C)

Publication Identifiers
ISBN - 9781538615898

Address
Buenos Aires, Argentina

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/icse-c.2017.100
URL - http://dx.doi.org/10.1109/icse-c.2017.100


Export

APA
Sina Shamshiri, Jose Campos, Gordon Fraser, Phil McMinn, (2017). Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away. 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C), -

IEEE
Sina Shamshiri, Jose Campos, Gordon Fraser, Phil McMinn, "Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away" in 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C), Buenos Aires, Argentina, 2017, pp. -, doi: 10.1109/icse-c.2017.100

BIBTEX
@InProceedings{43745, author = {Sina Shamshiri and Jose Campos and Gordon Fraser and Phil McMinn}, title = {Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away}, booktitle = {2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C)}, year = 2017, pages = {-}, address = {Buenos Aires, Argentina}, publisher = {IEEE} }