Exportar referência
APA
Sina Shamshiri, Jose Campos, Gordon Fraser, Phil McMinn, (2017). Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away. 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C), -
IEEE
Sina Shamshiri, Jose Campos, Gordon Fraser, Phil McMinn, "Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away" in 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C), Buenos Aires, Argentina, 2017, pp. -,
doi: 10.1109/icse-c.2017.100
BIBTEX
@InProceedings{43745,
author = {Sina Shamshiri and Jose Campos and Gordon Fraser and Phil McMinn},
title = {Disposable Testing: Avoiding Maintenance of Generated Unit Tests by Throwing Them Away},
booktitle = {2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C)},
year = 2017,
pages = {-},
address = {Buenos Aires, Argentina},
publisher = {IEEE}
}