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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Entropy-based test generation for improved fault localization

Participants in the publication
Jose Campos (Author)
Rui Abreu (Author)
Gordon Fraser (Author)
Marcelo d'Amorim (Author)

Date of Publication
2013-11

Event
2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE)

Publication Identifiers
ISBN - 9781479902156

Address
Silicon Valley, CA, USA

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/ase.2013.6693085
URL - http://dx.doi.org/10.1109/ase.2013.6693085


Export

APA
Jose Campos, Rui Abreu, Gordon Fraser, Marcelo d'Amorim, (2013). Entropy-based test generation for improved fault localization. 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), -

IEEE
Jose Campos, Rui Abreu, Gordon Fraser, Marcelo d'Amorim, "Entropy-based test generation for improved fault localization" in 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), Silicon Valley, CA, USA, 2013, pp. -, doi: 10.1109/ase.2013.6693085

BIBTEX
@InProceedings{43737, author = {Jose Campos and Rui Abreu and Gordon Fraser and Marcelo d'Amorim}, title = {Entropy-based test generation for improved fault localization}, booktitle = {2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE)}, year = 2013, pages = {-}, address = {Silicon Valley, CA, USA}, publisher = {IEEE} }