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APA
Jose Campos, Rui Abreu, Gordon Fraser, Marcelo d'Amorim, (2013). Entropy-based test generation for improved fault localization. 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), -
IEEE
Jose Campos, Rui Abreu, Gordon Fraser, Marcelo d'Amorim, "Entropy-based test generation for improved fault localization" in 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), Silicon Valley, CA, USA, 2013, pp. -,
doi: 10.1109/ase.2013.6693085
BIBTEX
@InProceedings{43737,
author = {Jose Campos and Rui Abreu and Gordon Fraser and Marcelo d'Amorim},
title = {Entropy-based test generation for improved fault localization},
booktitle = {2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE)},
year = 2013,
pages = {-},
address = {Silicon Valley, CA, USA},
publisher = {IEEE}
}