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Publication details

Document type
Journal articles

Document subtype
Full paper

Title
Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

Participants in the publication
M S Rodrigues (Author)
Dep. Física
 BioISI
 O Dhez (Author)
S Le Denmat (Author)
J Chevrier (Author)
R Felici (Author)
F Comin (Author)

Date of Publication
2008-12-30

Where published
Journal of Instrumentation

Publication Identifiers
ISSN - 1748-0221

Publisher
IOP Publishing

Volume
3
Number
12

Document Identifiers
DOI - https://doi.org/10.1088/1748-0221/3/12/p12004
URL - http://dx.doi.org/10.1088/1748-0221/3/12/p12004


Export

APA
M S Rodrigues, O Dhez, S Le Denmat, J Chevrier, R Felici, F Comin, (2008). Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope. Journal of Instrumentation, 3, ISSN 1748-0221. eISSN . http://dx.doi.org/10.1088/1748-0221/3/12/p12004

IEEE
M S Rodrigues, O Dhez, S Le Denmat, J Chevrier, R Felici, F Comin, "Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope" in Journal of Instrumentation, vol. 3, 2008. 10.1088/1748-0221/3/12/p12004

BIBTEX
@article{42093, author = {M S Rodrigues and O Dhez and S Le Denmat and J Chevrier and R Felici and F Comin}, title = {Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope}, journal = {Journal of Instrumentation}, year = 2008, volume = 3 }