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Publication details

Document type
Conference papers

Document subtype
Poster without full or short paper

Title
Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method

Participants in the publication
M.C.Brito (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
J.M. Serra (Author)
J.M. Alves (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
A.M.Vallera (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
SESUL - Centro de Sistemas de Energia Sustentáveis

Scope
International

Refereeing
Yes

Date of Publication
2004

Event
Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production

Publication Identifiers

Address
Slovenia


Export

APA
M.C.Brito, J.M. Serra, J.M. Alves, A.M.Vallera, (2004). Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method. Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production, -

IEEE
M.C.Brito, J.M. Serra, J.M. Alves, A.M.Vallera, "Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method" in Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production, Slovenia, 2004, pp. -, doi:

BIBTEX
@InProceedings{34595, author = {M.C.Brito and J.M. Serra and J.M. Alves and A.M.Vallera}, title = {Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method}, booktitle = {Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production}, year = 2004, pages = {-}, address = {Slovenia}, publisher = {} }