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APA
M.C.Brito, J.M. Serra, J.M. Alves, A.M.Vallera, (2004). Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method. Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production, -
IEEE
M.C.Brito, J.M. Serra, J.M. Alves, A.M.Vallera, "Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method" in Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production, Slovenia, 2004, pp. -,
doi:
BIBTEX
@InProceedings{34595,
author = {M.C.Brito and J.M. Serra and J.M. Alves and A.M.Vallera},
title = {Measurement Of Residual Stress In Multicrystalline Silicon Ribbons By A Self Calibrating Infrared Photoelastic Method},
booktitle = {Euroconference on Photovoltaic Devices: Manufacturing issues - From laboratory to mass production},
year = 2004,
pages = {-},
address = {Slovenia},
publisher = {}
}