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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Reliability of microwave photoconductivity lifetime measurements

Participants in the publication
D. Pera (Author)
J.M. Serra (Author)
M.C. Brito (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
J. Maia Alves (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
A.M. Vallêra (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
SESUL - Centro de Sistemas de Energia Sustentáveis

Scope
International

Refereeing
Yes

Date of Publication
2008

Event
23rd European Photovoltaic Solar Energy Conference

Publication Identifiers

Address
Valência

Starting page
498
Last page
500


Export

APA
D. Pera, J.M. Serra, M.C. Brito, J. Maia Alves, A.M. Vallêra, (2008). Reliability of microwave photoconductivity lifetime measurements. 23rd European Photovoltaic Solar Energy Conference, 498-500

IEEE
D. Pera, J.M. Serra, M.C. Brito, J. Maia Alves, A.M. Vallêra, "Reliability of microwave photoconductivity lifetime measurements" in 23rd European Photovoltaic Solar Energy Conference, Valência, 2008, pp. 498-500, doi:

BIBTEX
@InProceedings{34521, author = {D. Pera and J.M. Serra and M.C. Brito and J. Maia Alves and A.M. Vallêra}, title = {Reliability of microwave photoconductivity lifetime measurements}, booktitle = {23rd European Photovoltaic Solar Energy Conference}, year = 2008, pages = {498-500}, address = {Valência}, publisher = {} }