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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Reliability of microwave photoconductivity lifetime measurements

Participants in the publication
D. Pera (Author)
J.M. Serra (Author)
M.C. Brito (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
 IDL
 J. Maia Alves (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
 IDL
 A.M. Vallêra (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
 SESUL
Date of Publication
2008

Event
23rd European Photovoltaic Solar Energy Conference

Publication Identifiers

Address
Valência

Starting page
498
Last page
500

Document Identifiers
DOI - https://doi.org/10.4229/23rdEUPVSEC2008-1CV.2.17


Export

APA
D. Pera, J.M. Serra, M.C. Brito, J. Maia Alves, A.M. Vallêra, (2008). Reliability of microwave photoconductivity lifetime measurements. 23rd European Photovoltaic Solar Energy Conference, 498-500

IEEE
D. Pera, J.M. Serra, M.C. Brito, J. Maia Alves, A.M. Vallêra, "Reliability of microwave photoconductivity lifetime measurements" in 23rd European Photovoltaic Solar Energy Conference, Valência, 2008, pp. 498-500, doi: 10.4229/23rdEUPVSEC2008-1CV.2.17

BIBTEX
@InProceedings{34521, author = {D. Pera and J.M. Serra and M.C. Brito and J. Maia Alves and A.M. Vallêra}, title = {Reliability of microwave photoconductivity lifetime measurements}, booktitle = {23rd European Photovoltaic Solar Energy Conference}, year = 2008, pages = {498-500}, address = {Valência}, publisher = {} }