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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool

Participants in the publication
F. Rodrigues (Author)
J. Coelho (Author)
M. Abreu (Author)
Dep. Física
 LOLS
Date of Publication
2003

Event
2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666)

Publication Identifiers
ISSN - 0780377346

Address
Munich, Germany

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/cleoe.2003.1313556
URL - http://dx.doi.org/10.1109/cleoe.2003.1313556


Export

APA
F. Rodrigues, J. Coelho, M. Abreu, (2003). Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool. 2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666), -

IEEE
F. Rodrigues, J. Coelho, M. Abreu, "Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool" in 2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666), Munich, Germany, 2003, pp. -, doi: 10.1109/cleoe.2003.1313556

BIBTEX
@InProceedings{150, author = {F. Rodrigues and J. Coelho and M. Abreu}, title = {Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool}, booktitle = {2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666)}, year = 2003, pages = {-}, address = {Munich, Germany}, publisher = {IEEE} }