Exportar referência
APA
F. Rodrigues, J. Coelho, M. Abreu, (2003). Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool. 2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666), -
IEEE
F. Rodrigues, J. Coelho, M. Abreu, "Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool" in 2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666), Munich, Germany, 2003, pp. -,
doi: 10.1109/cleoe.2003.1313556
BIBTEX
@InProceedings{150,
author = {F. Rodrigues and J. Coelho and M. Abreu},
title = {Schlieren Interferometry as a Laser Materials Processing Diagnostic Tool},
booktitle = {2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666)},
year = 2003,
pages = {-},
address = {Munich, Germany},
publisher = {IEEE}
}