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Publication details

Document type
Conference papers

Document subtype
Extended abstract/Short paper

Title
Gate Branch Coverage: A Metric for Quantum Software Testing

Participants in the publication
Daniel Fortunato (Author)
José Campos (Author)
LASIGE
 Rui Abreu (Author)

Date of Publication
2024-07-16

Event
Proceedings of the 1st ACM International Workshop on Quantum Software Engineering: The Next Evolution

Publication Identifiers

Address
Porto de Galinhas Brazil

Publisher
ACM

Number of pages
4
Starting page
15
Last page
18

Document Identifiers
DOI - https://doi.org/10.1145/3663531.3664753
URL - https://doi.org/10.1145/3663531.3664753


Export

APA
Daniel Fortunato, José Campos, Rui Abreu, (2024). Gate Branch Coverage: A Metric for Quantum Software Testing. Proceedings of the 1st ACM International Workshop on Quantum Software Engineering: The Next Evolution, 15-18

IEEE
Daniel Fortunato, José Campos, Rui Abreu, "Gate Branch Coverage: A Metric for Quantum Software Testing" in Proceedings of the 1st ACM International Workshop on Quantum Software Engineering: The Next Evolution, Porto de Galinhas Brazil, 2024, pp. 15-18, doi: 10.1145/3663531.3664753

BIBTEX
@InProceedings{63142, author = {Daniel Fortunato and José Campos and Rui Abreu}, title = {Gate Branch Coverage: A Metric for Quantum Software Testing}, booktitle = {Proceedings of the 1st ACM International Workshop on Quantum Software Engineering: The Next Evolution}, year = 2024, pages = {15-18}, address = {Porto de Galinhas Brazil}, publisher = {ACM} }