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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
CTTB Memory Test Board Single Event Effect Geostationary in-flight Data Analysis

Participants in the publication
M. Pinto (Author)
J. M. Sampaio (Author)
Dep. Física
 LIP
 L. Arruda (Author)
P. Goncalves (Author)
P. Ribeiro (Author)
T. Sousa (Author)
C. Poivey (Author)
S. Bounasser (Author)

Date of Publication
2020-10

Event
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Publication Identifiers

Address
Toulouse, France

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/radecs50773.2020.9857705
URL - http://dx.doi.org/10.1109/radecs50773.2020.9857705


Export

APA
M. Pinto, J. M. Sampaio, L. Arruda, P. Goncalves, P. Ribeiro, T. Sousa, C. Poivey, S. Bounasser, (2020). CTTB Memory Test Board Single Event Effect Geostationary in-flight Data Analysis. 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS), -

IEEE
M. Pinto, J. M. Sampaio, L. Arruda, P. Goncalves, P. Ribeiro, T. Sousa, C. Poivey, S. Bounasser, "CTTB Memory Test Board Single Event Effect Geostationary in-flight Data Analysis" in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Toulouse, France, 2020, pp. -, doi: 10.1109/radecs50773.2020.9857705

BIBTEX
@InProceedings{55793, author = {M. Pinto and J. M. Sampaio and L. Arruda and P. Goncalves and P. Ribeiro and T. Sousa and C. Poivey and S. Bounasser}, title = {CTTB Memory Test Board Single Event Effect Geostationary in-flight Data Analysis}, booktitle = {2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)}, year = 2020, pages = {-}, address = {Toulouse, France}, publisher = {IEEE} }