BIBLIOS

  Ciências References Management System

Visitor Mode (Login)
Need help?


Back

Publication details

Document type
Conference papers

Document subtype
Full paper

Title
True Random Number Generators for Batch Control Sampling in Smart Factories

Participants in the publication
Leonardo C. Ribeiro (Author)
Ana C. O. Marcelino (Author)
Guilherme A. Garcia (Author)
Desiree S. Goncalves (Author)
Luiz V. G. Tarelho (Author)
Leandro P. Correa (Author)
Wladmir A. Chapetta (Author)
Alan De Oliveira Sa (Author)
Dep. Informática
Raphael C.S. Machado (Author)

Date of Publication
2018-04

Event
2018 Workshop on Metrology for Industry 4.0 and IoT

Publication Identifiers

Address
Brescia

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/metroi4.2018.8428319
URL - http://dx.doi.org/10.1109/metroi4.2018.8428319

Rankings
Google Metrics (2021) - 12


Export

APA
Leonardo C. Ribeiro, Ana C. O. Marcelino, Guilherme A. Garcia, Desiree S. Goncalves, Luiz V. G. Tarelho, Leandro P. Correa, Wladmir A. Chapetta, Alan De Oliveira Sa, Raphael C.S. Machado, (2018). True Random Number Generators for Batch Control Sampling in Smart Factories. 2018 Workshop on Metrology for Industry 4.0 and IoT, -

IEEE
Leonardo C. Ribeiro, Ana C. O. Marcelino, Guilherme A. Garcia, Desiree S. Goncalves, Luiz V. G. Tarelho, Leandro P. Correa, Wladmir A. Chapetta, Alan De Oliveira Sa, Raphael C.S. Machado, "True Random Number Generators for Batch Control Sampling in Smart Factories" in 2018 Workshop on Metrology for Industry 4.0 and IoT, Brescia, 2018, pp. -, doi: 10.1109/metroi4.2018.8428319

BIBTEX
@InProceedings{52312, author = {Leonardo C. Ribeiro and Ana C. O. Marcelino and Guilherme A. Garcia and Desiree S. Goncalves and Luiz V. G. Tarelho and Leandro P. Correa and Wladmir A. Chapetta and Alan De Oliveira Sa and Raphael C.S. Machado}, title = {True Random Number Generators for Batch Control Sampling in Smart Factories}, booktitle = {2018 Workshop on Metrology for Industry 4.0 and IoT}, year = 2018, pages = {-}, address = {Brescia}, publisher = {IEEE} }