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Detalhes Referência

Tipo
Artigos em Conferência

Tipo de Documento
Resumo

Título
Bias Reduction, Generalized Means and Truncation in Statistical EVT: All together Now...

Participantes na publicação
Maria Ivette Gomes (Author)
Dep. Estatística e Investigação Operacional
CEAUL

Data de Publicação
2021-07

Instituição
FACULDADE DE CIÊNCIAS DA UNIVERSIDADE DE LISBOA

Evento
Emeritus Celebration Prof. Jan Beirlant: Contributions in Extreme Value Statistics. September 30 - October 1, Department of Mathematics, KULeuwen

Identificadores da Publicação

Local
Leuwen, Belgium

Número de Páginas
1

Identificadores do Documento
URL - https://wis.kuleuven.be/events/2021EmeritaatJanBeirlant/programma
URL - https://www.researchgate.net/profile/Maria-Gomes-14/publication/353315176_Bias_Reduction_Generalized_Means_and_Truncation_in_Statistical_EVT_All_together_Now


Exportar referência

APA
Maria Ivette Gomes, (2021). Bias Reduction, Generalized Means and Truncation in Statistical EVT: All together Now.... Emeritus Celebration Prof. Jan Beirlant: Contributions in Extreme Value Statistics. September 30 - October 1, Department of Mathematics, KULeuwen, -

IEEE
Maria Ivette Gomes, "Bias Reduction, Generalized Means and Truncation in Statistical EVT: All together Now..." in Emeritus Celebration Prof. Jan Beirlant: Contributions in Extreme Value Statistics. September 30 - October 1, Department of Mathematics, KULeuwen, Leuwen, Belgium, 2021, pp. -, doi:

BIBTEX
@InProceedings{52119, author = {Maria Ivette Gomes}, title = {Bias Reduction, Generalized Means and Truncation in Statistical EVT: All together Now...}, booktitle = {Emeritus Celebration Prof. Jan Beirlant: Contributions in Extreme Value Statistics. September 30 - October 1, Department of Mathematics, KULeuwen}, year = 2021, pages = {-}, address = {Leuwen, Belgium}, publisher = {} }