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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology

Participants in the publication
Alexandre Cabral (Author)
INSTITUTO NACIONAL DE ENGENHARIA, TECNOLOGIA E INOVAÇÃO
José M. Rebordão (Author)
INSTITUTO NACIONAL DE ENGENHARIA, TECNOLOGIA E INOVAÇÃO
Manuel Abreu (Author)
INSTITUTO NACIONAL DE ENGENHARIA, TECNOLOGIA E INOVAÇÃO

Date of Publication
2008-08-10

Event
Optical Engineering + Applications

Publication Identifiers

Address
San Diego, California, USA

Publisher
SPIE

Document Identifiers
DOI - https://doi.org/10.1117/12.794620
URL - http://dx.doi.org/10.1117/12.794620


Export

APA
Alexandre Cabral, José M. Rebordão, Manuel Abreu, (2008). Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology. Optical Engineering + Applications, -

IEEE
Alexandre Cabral, José M. Rebordão, Manuel Abreu, "Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology" in Optical Engineering + Applications, San Diego, California, USA, 2008, pp. -, doi: 10.1117/12.794620

BIBTEX
@InProceedings{51983, author = {Alexandre Cabral and José M. Rebordão and Manuel Abreu}, title = {Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology}, booktitle = {Optical Engineering + Applications}, year = 2008, pages = {-}, address = {San Diego, California, USA}, publisher = {SPIE} }