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APA
João M. P. Coelho, Manuel A. Abreu, F. Carvalho Rodrigues, (2003). Application of schlieren interferometry to temperature measurements during laser welding of high-density polyethylene films. Applied Optics, 42,http://dx.doi.org/10.1364/ao.42.006327
IEEE
João M. P. Coelho, Manuel A. Abreu, F. Carvalho Rodrigues, "Application of schlieren interferometry to temperature measurements during laser welding of high-density polyethylene films" in Applied Optics, vol. 42, 2003.
10.1364/ao.42.006327
BIBTEX
@article{50911,
author = {João M. P. Coelho and Manuel A. Abreu and F. Carvalho Rodrigues},
title = {Application of schlieren interferometry to temperature measurements during laser welding of high-density polyethylene films},
journal = {Applied Optics},
year = 2003,
volume = 42
}