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APA
Tiago A. Marques, (2004). Predicting and Correcting Bias Caused by Measurement Error in Line Transect Sampling Using Multiplicative Error Models. Biometrics, 60, 757-763. http://dx.doi.org/10.1111/j.0006-341x.2004.00226.x
IEEE
Tiago A. Marques, "Predicting and Correcting Bias Caused by Measurement Error in Line Transect Sampling Using Multiplicative Error Models" in Biometrics, vol. 60, pp. 757-763, 2004.
10.1111/j.0006-341x.2004.00226.x
BIBTEX
@article{49900,
author = {Tiago A. Marques},
title = {Predicting and Correcting Bias Caused by Measurement Error in Line Transect Sampling Using Multiplicative Error Models},
journal = {Biometrics},
year = 2004,
pages = {757-763},
volume = 60
}