Exportar referência
APA
A. Montes, S. W. H. Eijt, Y. Tian, R. Gram, H. Schut, T. Suemasu, N. Usami, M. Zeman, J. Serra, O. Isabella, (2020). Point defects in BaSi2 thin films for photovoltaic applications studied by positron annihilation spectroscopy. Journal of Applied Physics, 127, ISSN 0021-8979. eISSN . http://dx.doi.org/10.1063/1.5126264
IEEE
A. Montes, S. W. H. Eijt, Y. Tian, R. Gram, H. Schut, T. Suemasu, N. Usami, M. Zeman, J. Serra, O. Isabella, "Point defects in BaSi2 thin films for photovoltaic applications studied by positron annihilation spectroscopy" in Journal of Applied Physics, vol. 127, 2020.
10.1063/1.5126264
BIBTEX
@article{48167,
author = {A. Montes and S. W. H. Eijt and Y. Tian and R. Gram and H. Schut and T. Suemasu and N. Usami and M. Zeman and J. Serra and O. Isabella},
title = {Point defects in BaSi2 thin films for photovoltaic applications studied by positron annihilation spectroscopy},
journal = {Journal of Applied Physics},
year = 2020,
volume = 127
}