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APA
David Paterson, Jose Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn, (2019). An Empirical Study on the Use of Defect Prediction for Test Case Prioritization. 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), -
IEEE
David Paterson, Jose Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn, "An Empirical Study on the Use of Defect Prediction for Test Case Prioritization" in 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), Xi'an, China, 2019, pp. -,
doi: 10.1109/icst.2019.00041
BIBTEX
@InProceedings{43749,
author = {David Paterson and Jose Campos and Rui Abreu and Gregory M. Kapfhammer and Gordon Fraser and Phil McMinn},
title = {An Empirical Study on the Use of Defect Prediction for Test Case Prioritization},
booktitle = {2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)},
year = 2019,
pages = {-},
address = {Xi'an, China},
publisher = {IEEE}
}