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Publication details

Document type
Conference papers

Document subtype
Full paper

Title
An Empirical Study on the Use of Defect Prediction for Test Case Prioritization

Participants in the publication
David Paterson (Author)
Jose Campos (Author)
Rui Abreu (Author)
Gregory M. Kapfhammer (Author)
Gordon Fraser (Author)
Phil McMinn (Author)

Date of Publication
2019-04

Event
2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)

Publication Identifiers
ISBN - 9781728117362

Address
Xi'an, China

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/icst.2019.00041
URL - http://dx.doi.org/10.1109/icst.2019.00041

Rankings
CORE A (2020) - - Computer Software


Export

APA
David Paterson, Jose Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn, (2019). An Empirical Study on the Use of Defect Prediction for Test Case Prioritization. 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), -

IEEE
David Paterson, Jose Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn, "An Empirical Study on the Use of Defect Prediction for Test Case Prioritization" in 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), Xi'an, China, 2019, pp. -, doi: 10.1109/icst.2019.00041

BIBTEX
@InProceedings{43749, author = {David Paterson and Jose Campos and Rui Abreu and Gregory M. Kapfhammer and Gordon Fraser and Phil McMinn}, title = {An Empirical Study on the Use of Defect Prediction for Test Case Prioritization}, booktitle = {2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)}, year = 2019, pages = {-}, address = {Xi'an, China}, publisher = {IEEE} }