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APA
M. S. Rodrigues, T. W. Cornelius, T. Scheler, C. Mocuta, A. Malachias, R. Magalhães-Paniago, O. Dhez, F. Comin, T. H. Metzger, J. Chevrier, (2009). In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction. Journal of Applied Physics, 106, ISSN 0021-8979. eISSN 1089-7550. http://dx.doi.org/10.1063/1.3262614
IEEE
M. S. Rodrigues, T. W. Cornelius, T. Scheler, C. Mocuta, A. Malachias, R. Magalhães-Paniago, O. Dhez, F. Comin, T. H. Metzger, J. Chevrier, "In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction" in Journal of Applied Physics, vol. 106, 2009.
10.1063/1.3262614
BIBTEX
@article{42094,
author = {M. S. Rodrigues and T. W. Cornelius and T. Scheler and C. Mocuta and A. Malachias and R. Magalhães-Paniago and O. Dhez and F. Comin and T. H. Metzger and J. Chevrier},
title = {In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction},
journal = {Journal of Applied Physics},
year = 2009,
volume = 106
}