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APA
T. Scheler, M. Rodrigues, T. W. Cornelius, C. Mocuta, A. Malachias, R. Magalhães-Paniago, F. Comin, J. Chevrier, T. H. Metzger, (2009). Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction. Applied Physics Letters, 94, ISSN 0003-6951. eISSN 1077-3118. http://dx.doi.org/10.1063/1.3067988
IEEE
T. Scheler, M. Rodrigues, T. W. Cornelius, C. Mocuta, A. Malachias, R. Magalhães-Paniago, F. Comin, J. Chevrier, T. H. Metzger, "Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction" in Applied Physics Letters, vol. 94, 2009.
10.1063/1.3067988
BIBTEX
@article{42092,
author = {T. Scheler and M. Rodrigues and T. W. Cornelius and C. Mocuta and A. Malachias and R. Magalhães-Paniago and F. Comin and J. Chevrier and T. H. Metzger},
title = {Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction},
journal = {Applied Physics Letters},
year = 2009,
volume = 94
}