BIBLIOS

  Ciências References Management System

Visitor Mode (Login)
Need help?


Back

Publication details

Document type
Conference papers

Document subtype
Extended abstract/Short paper

Title
Effects of prefrontal anodal transcranial direct current stimulation on working-memory and reaction time

Participants in the publication
Ines S. Verissimo (Author)
Isabel M. Barradas (Author)
Tiago T. Santos (Author)
Pedro C. Miranda (Author)
Dep. Física
IBEB
Hugo A. Ferreira (Author)
Dep. Física
IBEB
IBEB

Date of Publication
2016-08

Institution
FACULDADE DE CIÊNCIAS DA UNIVERSIDADE DE LISBOA

Event
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

Publication Identifiers
ISBN - 9781457702204

Address
Orlando, FL, USA

Publisher
IEEE

Document Identifiers
DOI - https://doi.org/10.1109/embc.2016.7591065
URL - http://dx.doi.org/10.1109/embc.2016.7591065


Export

APA
Ines S. Verissimo, Isabel M. Barradas, Tiago T. Santos, Pedro C. Miranda, Hugo A. Ferreira, (2016). Effects of prefrontal anodal transcranial direct current stimulation on working-memory and reaction time. 2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), -

IEEE
Ines S. Verissimo, Isabel M. Barradas, Tiago T. Santos, Pedro C. Miranda, Hugo A. Ferreira, "Effects of prefrontal anodal transcranial direct current stimulation on working-memory and reaction time" in 2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA, 2016, pp. -, doi: 10.1109/embc.2016.7591065

BIBTEX
@InProceedings{41108, author = {Ines S. Verissimo and Isabel M. Barradas and Tiago T. Santos and Pedro C. Miranda and Hugo A. Ferreira}, title = {Effects of prefrontal anodal transcranial direct current stimulation on working-memory and reaction time}, booktitle = {2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)}, year = 2016, pages = {-}, address = {Orlando, FL, USA}, publisher = {IEEE} }