Exportar referência
APA
João M. P. Coelho, Manuel A. Abreu, F. Carvalho Rodrigues, (2006). Schlieren interferometry and photodeflection techniques as diagnostic tools in laser processing analysis. New Topics in Lasers and Electro-Optics, 83-114
IEEE
João M. P. Coelho, Manuel A. Abreu, F. Carvalho Rodrigues, "Schlieren interferometry and photodeflection techniques as diagnostic tools in laser processing analysis" in New Topics in Lasers and Electro-Optics, 2006, pp. 83-114
BIBTEX
@incollection{410,
author = {João M. P. Coelho and Manuel A. Abreu and F. Carvalho Rodrigues},
title = {Schlieren interferometry and photodeflection techniques as diagnostic tools in laser processing analysis},
booktitle = {New Topics in Lasers and Electro-Optics},
year = 2006,
pages = {83-114},
address = {New York, USA},
publisher = { Nova Science Publishers, NY, USA}
}