Export
APA
J. Coelho, J. M. Rebordão, (2008). Optical metrology for nanotechnology. 2nd Workshop on Low-Dimentional Structures: properties and Applications, -
IEEE
J. Coelho, J. M. Rebordão, "Optical metrology for nanotechnology" in 2nd Workshop on Low-Dimentional Structures: properties and Applications, Aveiro, 2008, pp. -,
doi:
BIBTEX
@InProceedings{364,
author = {J. Coelho and J. M. Rebordão},
title = {Optical metrology for nanotechnology},
booktitle = {2nd Workshop on Low-Dimentional Structures: properties and Applications},
year = 2008,
pages = {-},
address = {Aveiro},
publisher = {}
}