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Publication details

Document type
Journal articles

Document subtype
Full paper

Title
Dual-frequency sweeping interferometry for absolute metrology of long distances

Participants in the publication
Alexandre Cabral (Author)
Dep. Física
 LOLS
 IA
 José Manuel Rebordão (Author)
Dep. Física
 LOLS
 IA
 Manuel Abreu (Author)
Dep. Física
 LOLS
 IA
Date of Publication
2010

Where published
Optical Engineering

Publication Identifiers
ISSN - 0091-3286

Publisher
SPIE-Intl Soc Optical Eng

Volume
49
Number
8

Starting page
85601
Last page
85615

Document Identifiers
DOI - https://doi.org/10.1117/1.3481105

Rankings
SCIMAGO Q1 (2019) - 0.424 - Atomic and Molecular Physics, and Optics (Q3)


Export

APA
Alexandre Cabral, José Manuel Rebordão, Manuel Abreu, (2010). Dual-frequency sweeping interferometry for absolute metrology of long distances. Optical Engineering, 49, 85601-85615. ISSN 0091-3286. eISSN .

IEEE
Alexandre Cabral, José Manuel Rebordão, Manuel Abreu, "Dual-frequency sweeping interferometry for absolute metrology of long distances" in Optical Engineering, vol. 49, pp. 85601-85615, 2010. 10.1117/1.3481105

BIBTEX
@article{36, author = {Alexandre Cabral and José Manuel Rebordão and Manuel Abreu}, title = {Dual-frequency sweeping interferometry for absolute metrology of long distances}, journal = {Optical Engineering}, year = 2010, pages = {85601-85615}, volume = 49 }