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APA
N. Franco, N. P. Barradas, E. Alves, A. M. Vallêra, R.J.H. Morris, T.J. Grasby, O.A. Mironov, E.H.C. Parker, (2005). XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 124, 123-126. ISSN 0921-5107. eISSN .
IEEE
N. Franco, N. P. Barradas, E. Alves, A. M. Vallêra, R.J.H. Morris, T.J. Grasby, O.A. Mironov, E.H.C. Parker, "XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates" in MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, vol. 124, pp. 123-126, 2005.
10.1016/j.mseb.2005.08.087
BIBTEX
@article{34584,
author = {N. Franco and N. P. Barradas and E. Alves and A. M. Vallêra and R.J.H. Morris and T.J. Grasby and O.A. Mironov and E.H.C. Parker},
title = {XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates},
journal = {MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS},
year = 2005,
pages = {123-126},
volume = 124
}