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APA
Maia Alves, J., Brito, M.C., Serra, J.M., Vallêra, A.M.., (2004). A differential mechanical profilometer for thickness measurement. REVIEW OF SCIENTIFIC INSTRUMENTS, 75, 5362-5363. ISSN 0034-6748. eISSN .
IEEE
Maia Alves, J., Brito, M.C., Serra, J.M., Vallêra, A.M.., "A differential mechanical profilometer for thickness measurement" in REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 75, pp. 5362-5363, 2004.
10.1063/1.1821627
BIBTEX
@article{34497,
author = {Maia Alves, J. and Brito, M.C. and Serra, J.M. and Vallêra, A.M..},
title = {A differential mechanical profilometer for thickness measurement},
journal = {REVIEW OF SCIENTIFIC INSTRUMENTS},
year = 2004,
pages = {5362-5363},
volume = 75
}