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Publication details

Document type
Journal articles

Document subtype
Full paper

Title
A differential mechanical profilometer for thickness measurement

Participants in the publication
Maia Alves, J. (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
Brito, M.C. (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
IDL - Instituto Dom Luiz
Serra, J.M. (Author)
Vallêra, A.M.. (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
SESUL - Centro de Sistemas de Energia Sustentáveis

Scope
International

Refereeing
Yes

Date of Publication
2004

Where published
REVIEW OF SCIENTIFIC INSTRUMENTS

Publication Identifiers
ISSN - 0034-6748

Publisher
AMER INST PHYSICS

Volume
75
Number
12

Starting page
5362
Last page
5363

Document Identifiers
DOI - https://doi.org/10.1063/1.1821627

Rankings
Web Of Science Q1 (2004) - 1.226 - Instruments & Instrumentation
Web Of Science Q2 (2004) - 1.226 - Physics, Applied
SCIMAGO Q1 (2004) - 1.13 - Instrumentation
SCIMAGO Q1 (2004) - 1.13 - Medicine (miscellaneous)


Export

APA
Maia Alves, J., Brito, M.C., Serra, J.M., Vallêra, A.M.., (2004). A differential mechanical profilometer for thickness measurement. REVIEW OF SCIENTIFIC INSTRUMENTS, 75, 5362-5363. ISSN 0034-6748. eISSN .

IEEE
Maia Alves, J., Brito, M.C., Serra, J.M., Vallêra, A.M.., "A differential mechanical profilometer for thickness measurement" in REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 75, pp. 5362-5363, 2004. 10.1063/1.1821627

BIBTEX
@article{34497, author = {Maia Alves, J. and Brito, M.C. and Serra, J.M. and Vallêra, A.M..}, title = {A differential mechanical profilometer for thickness measurement}, journal = {REVIEW OF SCIENTIFIC INSTRUMENTS}, year = 2004, pages = {5362-5363}, volume = 75 }