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APA
Brito, M.C., Pereira, J.P., Maia Alves, J., Serra, J.M., Vallêra, A.M.., (2005). Measurement of residual stress in multicrystalline silicon ribbons by a self calibrating infrared photoelastic method. REVIEW OF SCIENTIFIC INSTRUMENTS, 76, 013901-1-013901-6. ISSN 0034-6748. eISSN .
IEEE
Brito, M.C., Pereira, J.P., Maia Alves, J., Serra, J.M., Vallêra, A.M.., "Measurement of residual stress in multicrystalline silicon ribbons by a self calibrating infrared photoelastic method" in REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 76, pp. 013901-1-013901-6, 2005.
10.1063/1.1823654
BIBTEX
@article{34496,
author = {Brito, M.C. and Pereira, J.P. and Maia Alves, J. and Serra, J.M. and Vallêra, A.M..},
title = {Measurement of residual stress in multicrystalline silicon ribbons by a self calibrating infrared photoelastic method},
journal = {REVIEW OF SCIENTIFIC INSTRUMENTS},
year = 2005,
pages = {013901-1-013901-6},
volume = 76
}