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Publication details

Document type
Journal articles

Document subtype
Full paper

Title
RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications

Participants in the publication
N. Franco (Author)
E. Alves (Author)
A. Vallêra (Author)
Dep. Engenharia Geográfica, Geofísica e Energia
 SESUL
 R. J. H. Morris (Author)
T. J. Grasby O. A. Mironov (Author)
E. H. C. Parker (Author)
N. P. Barradas (Author)

Date of Publication
2006

Where published
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Publication Identifiers
ISSN - 0168-583X

Publisher
Elsevier BV

Volume
249
Number
1-2

Starting page
878
Last page
881

Document Identifiers
DOI - https://doi.org/10.1016/j.nimb.2006.03.155

Rankings
Web Of Science Q2 (2006) - 0.946 - Instruments & Instrumentation
Web Of Science Q1 (2006) - 0.946 - Nuclear Science & Technology
Web Of Science Q4 (2006) - 0.946 - Physics, Atomic, Molecular & Chemical
Web Of Science Q3 (2006) - 0.946 - Physics, Nuclear
SCIMAGO Q1 (2006) - 0.741 - Instrumentation
SCIMAGO Q2 (2006) - 0.741 - Nuclear & High Energy Physics

Keywords
SiGe heterostructures RBS XRD TEM


Export

APA
N. Franco, E. Alves, A. Vallêra, R. J. H. Morris, T. J. Grasby O. A. Mironov, E. H. C. Parker, N. P. Barradas, (2006). RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 249, 878-881. ISSN 0168-583X. eISSN .

IEEE
N. Franco, E. Alves, A. Vallêra, R. J. H. Morris, T. J. Grasby O. A. Mironov, E. H. C. Parker, N. P. Barradas, "RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol. 249, pp. 878-881, 2006. 10.1016/j.nimb.2006.03.155

BIBTEX
@article{17557, author = {N. Franco and E. Alves and A. Vallêra and R. J. H. Morris and T. J. Grasby O. A. Mironov and E. H. C. Parker and N. P. Barradas}, title = {RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications}, journal = {NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS}, year = 2006, pages = {878-881}, volume = 249 }