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Publication details

Document type
Journal articles

Document subtype
Full paper

Title
H+and He2+Induced W L X-rays intensity ratios: Part I, Si(Li) data and EDS high resolution insight

Participants in the publication
Chaves PC (Author)
Taborda A (Author)
Marques JP (Author)
Dep. Física
 BioISI
 Reis MA (Author)

Date of Publication
2013

Where published
X-RAY SPECTROMETRY

Publication Identifiers
ISSN - 0049-8246

Volume
42

Document Identifiers
DOI - https://doi.org/10.1002/xrs.2446


Export

APA
Chaves PC, Taborda A, Marques JP, Reis MA, (2013). H+and He2+Induced W L X-rays intensity ratios: Part I, Si(Li) data and EDS high resolution insight. X-RAY SPECTROMETRY, 42, ISSN 0049-8246. eISSN .

IEEE
Chaves PC, Taborda A, Marques JP, Reis MA, "H+and He2+Induced W L X-rays intensity ratios: Part I, Si(Li) data and EDS high resolution insight" in X-RAY SPECTROMETRY, vol. 42, 2013. 10.1002/xrs.2446

BIBTEX
@article{16867, author = {Chaves PC and Taborda A and Marques JP and Reis MA}, title = {H+and He2+Induced W L X-rays intensity ratios: Part I, Si(Li) data and EDS high resolution insight}, journal = {X-RAY SPECTROMETRY}, year = 2013, volume = 42 }